Contact Sign In
Header
Sub
desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc desc

High-Speed Mechanical Property Mapping

Park FX Large Sample AFM Series is designed for high-precision and versatile surface characterization, ideal for both research and industrial settings. Supporting samples from small size up to 300 mm wafers, it is the ultimate solution for semiconductor manufacturing, materials research, quality assurance, and a range of other nanoscale applications including chemical analysis at nanoscale.