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Park Heterodyne KPFM

A New Paradigm in
AFM Imaging Technology

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Superior Sensitivity & Spatial Resolution in
Surface Potential Mapping

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The Heterodyne Effect

How Does it Work?

Kelvin Probe Force Microscopy (KPFM) is a leading AFM technique for quantitative surface potential and work function measurement. Park Heterodyne KPFM builds upon this established technology with an innovative approach, by shifting the contact potential difference (CPD) signal away from the cantilever’s resonance frequency. This advancement significantly reduces noise and improves spatial resolution, making it ideal for high-precision surface potential analysis in applications such as 2D materials, semiconductors, and nanostructured materials.

Refined Sensitivity
Line profile chart showing signal precision of Heterodyne KPFM Application image demonstrating heterodyne KPFM performance
Park’s Heterodyne KPFM delivers enhanced resolution and sensitivity compared to conventional methods. By directing precise signals to targeted points near the AFM cantilever tip, it ensures more accurate data. In contrast, AM-KPFM gathers signals from multiple areas—including the tip end, tip side, and broader cantilever regions—leading to signal averaging and reduced precision.
*AM-KPFM (Amplitude-Modulation Based KPFM)
Exceptional Performance in
High Resolution Electrical Studies
Research results show that the Heterodyne KPFM method delivers significantly more quantitative and reliable results compared to conventional AM-KPFM. Unlike AM-KPFM, which can be influenced by stray electric fields, Heterodyne KPFM minimizes these effects — achieving up to ~99% agreement with ideal values, whereas AM-KPFM shows approximately ~60% accuracy. This makes Heterodyne KPFM a powerful choice for precise surface potential mapping, especially in advanced electrical studies.
Average Match Rate Comparison:
Park Heterodyne KPFM 99%
AM-KPFM 60%
Ideal Measurement (Baseline) 100%
*The performance rate showcased here is based on performance tests conducted in accordance with the methodology outlined in the publication by Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund, and Stefan A. L. Weber — ‘Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices.’
Durable Performance for Faster Measurements.
Making Your Research More Productive.
Experience high speed measurements without compromising accuracy. Even at elevated scan speeds Park Heterodyne KPFM delivers spatial resolution compared to conventional AM-KPFM, helping you save valuable time and streamline your workflow.
Preserving Spatial Resolution Comparable to AM-KPFM, Even at 20x Faster Measurement Speeds:
AM-KPFM
AM-KPFM
Park Heterodyne KPFM
1 Hz 5 Hz 10 Hz
Key Features
Sensitivity Icon
Superior Sensitivity
& Resolution
Isolates signals from background noise, ensuring precise nanoscale measurements.
Detection Icon
Localized
Detection
The heterodyne effect improves signal isolation for enhanced accuracy.
Artifacts Icon
Minimized
Frequency Artifacts
Avoids limitations seen in traditional KPFM modes.
Applications Icon
Ideal for
Diverse Applications
Perfect to get diverse electrical properties such as charge distribution, potential, and work function

Applications

Perfect for Diverse Applications

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Compatibility
Available via Hardware Upgrade on Park NX Series Systems
* Excluding Park NX20 Lite & NX7
✓ Included with All Park FX Series
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