Superior Sensitivity & Spatial Resolution in Surface Potential Mapping
System Compatibility
- Included with All Park FX Series
- Available bia Hardware Upgrade on Park NX Series Systems
* Excluding Park NX20 Lite & NX7
Kelvin Probe Force Microscopy (KPFM) is a leading AFM technique for quantitative surface potential and work function measurement. Park Heterodyne KPFM builds upon this established technology with an innovative approach, by shifting the contact potential difference (CPD) signal away from the cantilever’s resonance frequency. This advancement significantly reduces noise and improves spatial resolution, making it ideal for high-precision surface potential analysis in applications such as 2D materials, semiconductors, and nanostructured materials.
The Park Heterodyne KPFM offers superior resolution and sensitivity compared to traditional KPFM methods by delivering precise data through accurate signals directed to the closest areas of the AFM's cantilever tip from the specific desire point. In contrast, AM-KPFM detects signals from multiple parts, such as the tip end, tip side, and wide areas of the cantilever, which can cause signal averaging.
Research results show that the Heterodyne KPFM method delivers significantly more quantitative and reliable results compared to conventional AM-KPFM. Unlike AM-KPFM, which can be influenced by stray electric fields, Heterodyne KPFM minimizes these effects — achieving up to ~99% agreement with ideal values, whereas AM-KPFM shows approximately ~60% accuracy. This makes Heterodyne KPFM a powerful choice for precise surface potential mapping, especially in advanced electrical studies.
* The performance rate showcased here is based on performance tests conducted in accordance with the methodology outlined in the publication by Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund, and Stefan A. L. Weber — ‘Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices.
Experience high speed measurements without compromising accuracy. Even at elevated scan speeds Park Heterodyne KPFM delivers spatial resolution compared to conventional AM-KPFM, helping you save valuable time and streamline your workflow.
Isolates signals from background noise, ensuring precise nanoscale measurements.
The heterodyne effect improves signal isolation for enhanced accuracy.
Avoids limitations seen in traditional KPFM modes.
Perfect for semiconductor devices, perovskite solar cells, and soft materials research.
