FX40 with monitor

Park NX20 Lite

The Most Affordable AFM System for Wafer Measurement and Analysis

Park NX20 Lite is a cost-effective yet advanced AFM system, offering top performance for inspecting large samples. This technologically advanced AFM is tailored for the inspection of large samples and boasts a range of innovative features.

Increase Your Productivity with Our Powerfully Versatile AFM

The Park NX20 Lite includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.

The Most Convenient Sample Measurements with MultiSample Scan

최대 16개의 개별 샘플을 수용할 수 있는 특수 설계된 다중 샘플 척을 활용하여 여러 샘플을 한 번에 처리할 수 있는 자동화 이미징 기능을 갖추고 있습니다. 이 시스템은 최대 150 mm x 150 mm의 넓은 이동 범위를 제공하는 완전 모터화된 XY 샘플 스테이지를 장착하여 샘플 처리의 포괄적인 커버리지와 높은 효율성을 보장합니다.

Accurate XY Scan by Crosstalk Elimination

평평하고 직교하는 XY 스캔을 보장하는 두 개의 독립적인 폐쇄 루프 XY 및 Z 플렉서 스캐너를 특징으로 하며, 잔여 굽힘이 적어 우수한 이미징 충실도를 제공합니다. NX 전자 컨트롤러로 강화된 이 시스템은 소프트웨어 처리를 사용하지 않고도 더 정확한 높이 측정을 제공하여 모든 차원에서 정밀도를 최적화합니다.

Best Tip Life, Resolution and Sample Preservation by True Non-Contact™ Mode

빠른 Z-서보 속도를 갖춘 우리 시스템은 고품질의 고해상도 이미징 기능의 수명을 연장하고 팁 마모를 최소화하는 True Non-Contact™ 모드를 지원합니다.

Versatile Range of Modes and Options

포괄적인 측정 모드와 특성화를 특징으로 하며, 선택적 액세서리와 업그레이드를 통해 확장된 기능을 제공하며, 상세한 고장 분석(FA)에 필수적인 고급 전기 측정을 제공합니다

Achieve Superior Results with Our Economically Advanced, High-Efficiency AFM

  • The most convenient sample measurements with MultiSample™ scan

    The Park NX20 Lite MultiSample™ scan system offers automated imaging of multiple samples in one pass, featuring a specially designed multi-sample chuck that can load up to 16 individual samples. It includes a fully motorized XY sample stage that travels up to 150 mm x 150 mm, and with its motorized capabilities, the MultiSample Scan™ facilitates programmable multiple region imaging through step-and-scan automation.

    The most convenient sample measurements with MultiSample™ scan
  • Flat Orthogonal XY Scanning without Scanner Bow

    Park's Crosstalk Elimination scanner structure removes scanner bow, allowing flat orthogonal XY scanning regardless of scan location, scan rate, and scan size. It shows no background curvature even on flattest samples, such as an optical flat, and with various scan offsets. This provides you with a very accurate height measurement and precision nanometrology for the most challenging problems in research and engineering.

    Flat Orthogonal XY Scanning without Scanner Bow
  • Industry Leading Low Noise Z Detector

    Park AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate sample topography and no edge overshoot. Just one of the many ways Park NX series saves you time and gives you better data.

    Industry Leading Low Noise Z Detector

Applications

Perfect for Diverse Applications